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CMI250測(cè)厚儀
CMI250測(cè)厚儀
CMI250測(cè)厚儀測(cè)厚儀產(chǎn)品描述:
Dual technology features magnetic induction and Eddy Current measurement techniques with statistical analysis and PC interface. The CMI250 is a feature rich instrument built upon our established Eddy Current / Magnetic Induction dual probe technology.
The instrument offers factory and user calibrations, automatic temperature compensation, base corrections, measurement storage options, date and time stamping, statistical analysis, and USB PC connectivity.
Useful in a wide variety of settings, the CMI250 measures non-conductive coatings over non-ferrous substrates and non-magnetic coatings over ferrous substrates
聯(lián)系人:林經(jīng)理(銷售部)
手機(jī):15362631738
郵箱:gryq3385@163.com
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